Circuit Design for Reliability

AvRicardo Reis,Yu Cao

Inbunden, Engelska, 2014

1 104 kr

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E-bok

1 427 kr

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1 135 kr

Beskrivning

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Produktinformation

Utgivningsdatum:2014-11-08
Mått:155 x 235 x 21 mm
Vikt:588 g
Format:Inbunden
Språk:Engelska
Antal sidor:272
Upplaga:2015
Förlag:Springer-Verlag New York Inc.
ISBN:9781461440772

Utforska kategorier

Innehållsförteckning

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

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