Characterization of Wide Bandgap Power Semiconductor Devices

Fei (Fred) Wang is Professor of Electrical Engineering and Condra Chair of Excellence in Power Electronics, and Technical Director of NSF/DOE Engineering Research Center CURENT at The University of Tennessee, Knoxville, USA. He also holds a joint appointment with Oak Ridge National Lab. Prof. Wang has published over 400 journal and conference papers, authored 3 book chapters, and holds 15 US patents. He is a fellow of IEEE and NAI.Zheyu Zhang is a Lead Power Electronics Engineer with General Electric Global Research. He was a Research Assistant Professor at the University of Tennessee, Knoxville from 2015 to 2018. He has published over 60 papers in the most prestigious journals and conference proceedings, four patent applications with one licensed, and two IEEE tutorial seminars. He was the recipient of two IEEE prize paper awards.Edward A. Jones is a Senior Applications Engineer with Efficient Power Conversion Corporation. He completed his Ph.D. at The University of Tennessee, where he was a Chancellor's Fellow, a CURENT Fellow, and a Bredesen Energy Sciences and Engineering Fellow. He has published over 20 peer-reviewed IEEE papers, an IEEE tutorial seminar, and a patent.

• Chapter 1: IntroductionChapter 2: Pulsed static characterizationChapter 3: Junction capacitance characterizationChapter 4: Fundamentals of dynamic characterizationChapter 5: Gate drive for dynamic characterizationChapter 6: Layout design and parasitic managementChapter 7: Protection design for double pulse testChapter 8: Measurement and data processing for dynamic characterizationChapter 9: Cross-talk considerationChapter 10: Impact of three-phase systemChapter 11: Topology considerationAppendix A: Recommended equipment and components list for DPT setupAppendix B: Data processing code for dynamic characterization