Springer Handbook of Microscopy

Peter Hawkes received his Ph.D. in Physics from the University of Cambridge in 1963, after which he continued his research on electron optics, and in particular on aberration theory and image processing, in the Cavendish Laboratory until 1975. He then moved to the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987, and published extensively on electron lens aberrations and theoretical aspects of image processing. In 2002, he was awarded the status of Emeritus CNRS Director of Research. He has been President of the French Microscopy Society and was Founder-President of the European Microscopy Society. John Spence FRS received his Ph.D. in Physics from Melbourne in 1973 followed by post-doctoral work in Oxford, UK. He joined John Cowley's electron microscopy group in Physics at Arizona State University in 1977 where he is Regent's Professor of Physics. His group has undertaken research in diffraction physics and novel microscopieswith applications in condensed matter physics, materials science and structural biology. He is currently Director of Science for an NSF consortium of seven US universities in the development and application of free-electron X-ray lasers to biology.

“This book highlights the unity of electron microscopy, X-ray microscopy and optical microscopy … . This handbook is a recommended source of information on microscopy theory, instrumentation, applications, limitations, trade-offs and pitfalls. … The contributors have produced outstanding chapters, which should be noted for their comprehensive analysis of the theory and the instruments, their critical selection of figures, and their selection of key references.” (Barry R. Masters, Optics & Photonics News, April 9, 2020)

• Part A: Electron and Ion Microscopy.- Kirkland et al.: Atomic Resolution Transmission Electron Microscopy.- Nellist: Scanning Transmission Electron Microscopy.- Ross & Minor: In situ Transmission Electron Microscopy.- Plitzko & Baumeister: Crytoelectron TEM.- Erdmann et al: Scanning Electron Microscopy.- Thiel: Variable Pressure Scanning Electron Microscopy.- Botton, Pradhudev: Analytical Electron Microscopy.- Campbell et al: High-Speed Electron Microscopy.- Bauer: LEEM, SPLEEM and SPELEEM.- Feng & Scholl: Photoemission Electron Microscopy.- Tromp: Spectroscopy with the Low Energy Electron Microscope.- Van Aert: Model-Based Electron Microscopy.- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer.- Hlawacek: Ion Microscopy.-Kelly: Atom-Probe Tomography.- Part B: Holography, Ptychography and Diffraction.- Dunin-Borkowski et al.: Electron Holography.-Rodenburg & Maiden: Ptychography.- Zuo: Electron Nanodiffraction.- Musumeci & Li: High-Energy Time-Resolved Electron Diffraction.- Spence: Diffractive Imaging of Single Particles.- Part C: Photon-based Microscopy.- Diaspro et al: Fluorescence Microscopy.- Sahl et al.: Far-Field Fluorescence Microscopy.- Jacobson et al: Zone-Plate X-Ray Microscopy.- Lin et al: Microcomputed Tomography.-  Part D:  Applied Microscopy.- Huey et al: Scanning Probe Microscopy in Materials Science.- Leary & Midgeley: Electron Tomography in Materials Science.- Sutter: Scanning Tunneling Microscopy in Surface Science.- Hamidian et al: Visualizing electronic quantum matter.- Ma et al (Terasaki): Microscopy of Nanoporous Crystals.- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography.-  Amrein & Stamov: Atomic Force Microscopy in the Life Sciences.- Jones: Microscopy in Forensic Sciences.