Hardware and Software: Verification and Testing

7th International Haifa Verification Conference, HVC 2011, Haifa, Israel, December 6-8, 2011, Revised Selected Papers

AvKerstin Eder,João Lourenҫo

Häftad, Engelska, 2012

Del i serien Lecture Notes in Computer Science

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Beskrivning

This book constitutes the thoroughly refereed post-conference proceedings of the 7th International Haifa Verification Conference, HVC 2011, held in Haifa, Israel in December 2011. The 15 revised full papers presented together with 3 tool papers and 4 posters were carefully reviewed and selected from 43 submissions.

Produktinformation

Utgivningsdatum:2012-10-09
Mått:155 x 235 x 16 mm
Vikt:423 g
Format:Häftad
Språk:Engelska
Serie:Lecture Notes in Computer Science
Antal sidor:263
Upplaga:2012
Förlag:Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN:9783642341878

Utforska kategorier

Systemvetenskap och AI inom Data och IT
Programvaruutveckling inom Data och IT
Artificiell intelligens inom Data och IT

Innehållsförteckning

Preprocessing and Inprocessing Techniques in SAT.- Pioneering the Future of Verification: A Spiral of Technological and Business Innovation.- Automated Detection and Repair of Concurrency Bugs.- Verification Challenges of Workload Optimized Hardware Systems.- Synthesis with Clairvoyance.- Generalized Reactivity(1) Synthesis without a Monolithic Strategy.- IIS-Guided DFS for Efficient Bounded Reachability Analysis of Linear Hybrid Automata.- Cube and Conquer: Guiding CDCL SAT Solvers by Lookaheads.Implicative Simultaneous Satisfiability and Applications.- Liveness vs Safety – A Practical Viewpoint.- Predicting Serializability Violations: SMT-Based Search vs. DPOR-Based Search.- SAM: Self-adaptive Dynamic Analysis for Multithreaded Programs.- Concurrent Small Progress Measures.- Specification and Quantitative Analysis of Probabilistic Cloud Deployment Patterns.- Interpolation-Based Function Summaries in Bounded Model Checking.- Can File Level Characteristics Help Identify System Level Fault-Proneness.- Reverse Coverage Analysis.- Symbolic Testing of OpenCL Code.- Dynamic Test Data Generation for Data Intensive Applications.- Injecting Floating-Point Testing Knowledge into Test Generators.- Combining Theorem Proving and Symbolic Trajectory Evaluation in THM&STE.- HAVEN: An Open Framework for FPGA-Accelerated Functional Verification of Hardware.- On-Line Detection and Prediction of Temporal Patterns.- Function Summaries in Software Upgrade Checking.- The Rabin Index of Parity Games.- Using Computational Biology Methods to Improve Post-silicon Microprocessor Testing. .- ioneering the Future of Verification: A Spiral of Technological and Business Innovation.- Automated Detection and Repair of Concurrency Bugs.- Verification Challenges of Workload Optimized Hardware Systems.- Synthesis with Clairvoyance.- Generalized Reactivity(1) Synthesis without a Monolithic Strategy.- IIS-Guided DFS for Efficient Bounded Reachability Analysis of Linear HybridAutomata.- Cube and Conquer: Guiding CDCL SAT Solvers by Lookaheads.Implicative Simultaneous Satisfiability and Applications.- Liveness vs Safety – A Practical Viewpoint.- Predicting Serializability Violations: SMT-Based Search vs. DPOR-Based Search.- SAM: Self-adaptive Dynamic Analysis for Multithreaded Programs.- Concurrent Small Progress Measures.- Specification and Quantitative Analysis of Probabilistic Cloud Deployment Patterns.- Interpolation-Based Function Summaries in Bounded Model Checking.- Can File Level Characteristics Help Identify System Level Fault-Proneness.- Reverse Coverage Analysis.- Symbolic Testing of OpenCL Code.- Dynamic Test Data Generation for Data Intensive Applications.- Injecting Floating-Point Testing Knowledge into Test Generators.- Combining Theorem Proving and Symbolic Trajectory Evaluation in THM&STE.- HAVEN: An Open Framework for FPGA-Accelerated Functional Verification of Hardware.- On-Line Detection and Prediction of Temporal Patterns.- Function Summaries in Software Upgrade Checking.- The Rabin Index of Parity Games.- Using Computational Biology Methods to Improve Post-silicon Microprocessor Testing.