Resonant X-Ray Scattering in Correlated Systems

Häftad, Engelska, 2018

Del 269 i serien Springer Tracts in Modern Physics

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Beskrivning

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides.

Produktinformation

Utgivningsdatum:2018-07-07
Mått:155 x 235 x 14 mm
Vikt:388 g
Format:Häftad
Språk:Engelska
Serie:Springer Tracts in Modern Physics
Antal sidor:241
Förlag:Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN:9783662571224

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Mer om författaren

Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan.Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.

Innehållsförteckning

Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara).- Resonant X-ray scattering in 3d electron systems (H. Nakao).- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura).- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima).- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati).- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).