Electron Microscopy In Materials Science - Proceedings Of The International School

Inbunden, Engelska, 1993

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Beskrivning

This volume contains an updated description of the experimental methods currently used in both Scanning and Transmission Electron Microscopy as well as the principles of electron optics and an outline of the most recent instrumental developments.The authors introduce the fundamental principles at the basis of the different techniques, the approximation used in the development of the theories, their range of validity, while stressing how to get microstructural information relevant in Materials Science.

Produktinformation

Utgivningsdatum:1993-01-01
Format:Inbunden
Språk:Engelska
Antal sidor:696
Förlag:World Scientific Publishing Co Pte Ltd
ISBN:9789810209247

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Recensioner i media

"The standard here is very high indeed and there is, moreover, very little overlap with the Dundee school ... The editors must be congratulated on so very interesting a collection. An excellent way of understanding the new developments in our subject, not to be missed on any account." Ultramicroscopy, 1993

Innehållsförteckning

Electron optics and instrumentation, K.v.d. Mast; wave optical theory of imaging and electron holography, G. Pozzi; diffraction contrast - kinematical theory dynamical theory, defect simulation, S. Amelinckx; electron cristallography, J.W. Steeds; scanning transmission electron micsroscopy, S.J. Pennycook; electron energy loss spectroscopy, B. Jouffrey; x-ray analysis for TEM, A. Armigliato; the instrument - electron and backscattered electrons, O. Wells; x-ray analysis for SEM, C.E. Fiori; voltage contrast, M. Vanzi; cathodoluminescence techniques, G. Saparin; Monte Carlo methods, F. Salvat; electron beam induced current, H. Holt; scanning tunnelling microscopy, S. Selci; atomic force microscopy, L. Scandella.