New Technologies in Electromagnetic Non-destructive Testing

AvSongling Huang,Shen Wang

Häftad, Engelska, 2018

Del i serien Springer Series in Measurement Science and Technology

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Beskrivning

The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current testing, low frequency eddy current testing, metal magnetic memory testing, and magnetic flux leakage testing.

Produktinformation

Utgivningsdatum:2018-04-25
Mått:155 x 235 x 13 mm
Vikt:359 g
Format:Häftad
Språk:Engelska
Serie:Springer Series in Measurement Science and Technology
Antal sidor:222
Förlag:Springer Verlag, Singapore
ISBN:9789811091995

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Innehållsförteckning

Electromagnetic ultrasonic guided wave testing.- Outline.- Factors influencing the performance of EMATs.- EMATs for pipeline axial guided wave generation.- The dispersion characteristic of the guided waves.- The electromagnetic ultrasonic guided wave testing technology.- Pulsed eddy current testing.- Basic principle of electromagnetism.- The coil type probe for the pulsed eddy current testing.- The electronic circuit used in the pulsed eddy current testing.- The remote field eddy current testing.- The mathematical model of the remote field eddy current testing.- The finite element simulation and modeling of the remote field eddy current in the pipeline.- The 2D finite element simulation of the remote field eddy current in the pipeline.- The 3D finite element simulation of the remote field eddy current in the pipeline.- Low frequency eddy current testing.- The low frequency eddy current-based testing system of the pipeline deformation.- The metal magnetic memory testing.- The principleof testing.- The relation between the magnetic field of the earth and the magnetic memory of the ferromagnetic materials.- Measuring the distribution of the stress using the metal magnetic memory.- The magnetic flux leakage testing.- The principle of the MFL testing.- The factors influencing the MFL testing.- The defect size quantification methods in the MFL testing.- The pulsed MFL testing.- References.