Optical Metrology and Optoacoustics in Nondestructive Evaluation of Materials

Zinoviy Nazarchuk is a director at the Karpenko Physico-Mechanical Institute (PMI) of the National Academy of Sciences of Ukraine (NASU). His work is involved in wave theory and theory of nondestructive testing and technical diagnostics in applied mathematics. He received his Candidate of Science (Ph.D.) and Doctor of Science degrees from the Kharkiv State University in 1982 and 1990, respectively. He was a senior researcher, head of the Laboratory and head of the Department of the Karpenko PMI of NASU. He became the vice-director in 1991 and has served in his current position as director since 2014. He became a professor of theoretical physics in 1998 and was elected as an Academician of NASU in 2006. He has also been a member of the NASU presidium since 2007, head of the Western Scientific Center of NASU and Ministry of Education and Science of Ukraine, and a principal researcher of the Department of the Theory of Wave Processes and Optical Systems of Diagnostics. He has also served as the editor-in-chief of an interbranch collection of scientific papers Information Extraction and Processing and the international journal Materials Science since 1997 and 2020, respectively. He was awarded the Ukrainian State Prize in Science and Engineering, elected as a senior member of IEEE and an honored Science and Engineering Worker of Ukraine in 1995, 1999 and 2002, respectively.Leonid Muravsky is a leading researcher in the Department of the Theory of Wave Processes and Optical Systems of Diagnostics at the Karpenko PMI of NASU. His work mainly focuses on theoretical and practical principles of technical diagnostics of structural-material properties and their implementation by optical-digital methods. He received his Ph.D. in information-measuring systems and optoelectronic devices and Doctor of Science in information-measuring systems from Karpenko PMI in 1989 and 2002, respectively. He was head of the Department of Optical-Digital Diagnostics Systems at Karpenko PMI, and became a professor in 2015. He has served in his current position since 2020. He has been a SPIE senior member since 2014. He was elected as a corresponding member of NASU in 2021. He received a diploma from the Verkhovna Rada of Ukraine in 2011 and honorable diplomas of NASU and of the Lviv Regional State Administration in 2013, and was honored with the award of NASU for professional achievements in 2018.Dozyslav Kuryliak is a leading researcher in the Department of the Theory of Wave Processes and Optical Systems of Diagnostics at the Karpenko PMI of NASU. His work mainly focuses on functional-theoretical methods for rigorous wave diffraction analysis and their application for modeling electro-magnetic, acoustic and elastic wave scattering from defects. He received his Ph.D. from Kharkiv State University and Doctor of Science degrees in radio physics from the O.Ya. Usikov Institute of Radio-Physics and Electronics of NASU in 1988 and 2002, respectively. He was head of the Department of Physical Bases of Materials Diagnostics in 2007–2020. He has received the scientific rank of senior researcher on radio-physics and became a professor of physics and astronomy in 1995 and 2019, respectively. He was also a professor in the Department of Electronic Computing Machines at Lviv Polytechnic National University. He has been awarded the Ukrainian State Prize in Science and Technology in 2006 and elected as a senior member of IEEE in 2021.

• Optical Metrology and Optoacoustics Techniques for Nondestructive Evaluation of Materials.- Phase Shifting Interferometry Techniques for Surface Parameters Measurement.- Application of Phase Shifting Interferometry Methods for Diagnostics of Materials Surface.- Digital Speckle Pattern Interferometry for Studying Surface Deformation and Fracture of Materials.- New Methods of Speckle Metrology in Analysis of Rough Surfaces.- Methods for Processing and Analyzing the Speckle Patterns of Materials Surface.- Mathematical Modeling of Elastic Waves Interaction with Interface Crack-type Defects.