The goal of the book "X-Ray Photoelectron Spectroscopy: Principles, Techniques, and Applications" is to offer a thorough and in-depth investigation of X-ray photoelectron spectroscopy (XPS), a potent analytical technique that is widely applied in many scientific and technological disciplines. The kinetic energy and number of escaping electrons from the top few layers (up to 10 nm) of a material are simultaneously quantified to form an XPS spectrum when the sample is subjected to an X-ray beam for analytical purposes. The elemental composition, empirical formula, chemical state, and electronic state of the elements present in a material can all be ascertained using this highly surface-sensitive method. This book also describes the instrumentation of the XPS technique, its spectral interpretation, and various applications including the determination of the electronic band structures, Schottky barriers heights, analysis of various carbonaceous materials, chemical characterization of several biomaterials and polymers, applications in the field of art and archaeology and analysis of various biological systems.
