Amith Singhee – författare
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6 produkter
Extreme Statistics in Nanoscale Memory Design
Av Amith Singhee, Rob A. Rutenbar
Inbunden, 2010
1643 kr
Lägg i varukorg
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, …
Extreme Statistics in Nanoscale Memory Design
Av Rob A. Rutenbar, Amith Singhee
E-bok, 2010
2111 kr
Lägg i varukorg
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, …
Extreme Statistics in Nanoscale Memory Design
Av Amith Singhee, Rob A. Rutenbar
Häftad, 2012
1643 kr
Lägg i varukorg
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, …
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Av Amith Singhee, Rob A. Rutenbar
Inbunden, 2009
1098 kr
Lägg i varukorg
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the …
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Av Rob A. Rutenbar, Amith Singhee
E-bok, 2009
1427 kr
Lägg i varukorg
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the …
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Av Amith Singhee, Rob A. Rutenbar
Häftad, 2012
1098 kr
Lägg i varukorg
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the …
