Budhika G Mendis – författare

Cathodoluminescence is the technique of stimulating luminescence (i.e. light emission) from materials using an electron beam in an electron microscope. Luminescence provides information on energy levels of single electrons, as well as the collective behaviour of a large number of electrons (i.e. plasmons) within the solid. Since electron microscopes routinely achieve spatial resolutions of a few nanometres, cathodoluminescence can be used to probe both atomic scale defects and optoelectronic/plasmonic devices, serving as a useful tool for both fundamental and applied studies.Chapters cover the background material on each specific topic and provide examples of how cathodoluminescence can be used (e.g. semiconductor band gaps and band-to-band recombination). Appendices include more complicated mathematical derivations and to explain background material in more detail. The book also contains the latest, cutting-edge developments in cathodoluminescence, including time-resolved studies and photonic crystals.Key features:• Covers new topics in cathodoluminescence as well as instrument development.• Discusses the background science behind cathodoluminescence.• Written with the practitioner of cathodoluminescence in mind.This book is an introductory text to cathodoluminescence aimed at early career researchers, in addition to graduate students in physics, materials science, and chemistry. It provides an accessible introduction to the topic, with a focus on discussing the underlying physics in an easy-to-understand manner and in the context of cathodoluminescence, facilitating readers to conduct their own routine experiments in cathodoluminescence.

Cathodoluminescence is the technique of stimulating luminescence (i.e. light emission) from materials using an electron beam in an electron microscope. Luminescence provides information on energy levels of single electrons, as well as the collective behaviour of a large number of electrons (i.e. plasmons) within the solid. Since electron microscopes routinely achieve spatial resolutions of a few nanometres, cathodoluminescence can be used to probe both atomic scale defects and optoelectronic/plasmonic devices, serving as a useful tool for both fundamental and applied studies.Chapters cover the background material on each specific topic and provide examples of how cathodoluminescence can be used (e.g. semiconductor band gaps and band-to-band recombination). Appendices include more complicated mathematical derivations and to explain background material in more detail. The book also contains the latest, cutting-edge developments in cathodoluminescence, including time-resolved studies and photonic crystals.Key features:• Covers new topics in cathodoluminescence as well as instrument development.• Discusses the background science behind cathodoluminescence.• Written with the practitioner of cathodoluminescence in mind.This book is an introductory text to cathodoluminescence aimed at early career researchers, in addition to graduate students in physics, materials science, and chemistry. It provides an accessible introduction to the topic, with a focus on discussing the underlying physics in an easy-to-understand manner and in the context of cathodoluminescence, facilitating readers to conduct their own routine experiments in cathodoluminescence.

A detailed presentation of the physics of electron beam-specimen interactionsElectron microscopy is one of the most widely used characterisation techniques in materials science, physics, chemistry, and the life sciences. This book examines the interactions between the electron beam and the specimen, the fundamental starting point for all electron microscopy. Detailed explanations are provided to help reinforce understanding, and new topics at the forefront of current research are presented. It provides readers with a deeper knowledge of the subject, particularly if they intend to simulate electron beam-specimen interactions as part of their research projects. The book covers the vast majority of commonly used electron microscopy techniques. Some of the more advanced topics (annular bright field and dopant atom imaging, atomic resolution chemical analysis, band gap measurements) provide additional value, especially for readers who have access to advanced instrumentation, such as aberration-corrected and monochromated microscopes.Electron Beam-Specimen Interactions and Simulation Methods in Microscopy offers enlightening coverage of: the Monte-Carlo Method; Multislice Simulations; Bloch Waves in Conventional and Analytical Transmission Electron Microscopy; Bloch Waves in Scanning Transmission Electron Microscopy; Low Energy Loss and Core Loss EELS. It also supplements each chapter with clear diagrams and provides appendices at the end of the book to assist with the pre-requisites. A detailed presentation of the physics of electron beam-specimen interactionsEach chapter first discusses the background physics before moving onto simulation methodsUses computer programs to simulate electron beam-specimen interactions (presented in the form of case studies)Includes hot topics brought to light due to advances in instrumentation (particularly aberration-corrected and monochromated microscopes)Electron Beam-Specimen Interactions and Simulation Methods in Microscopy benefits students undertaking higher education degrees, practicing electron microscopists who wish to learn more about their subject, and researchers who wish to obtain a deeper understanding of the subject matter for their own work.

A detailed presentation of the physics of electron beam-specimen interactions

Electron microscopy is one of the most widely used characterisation techniques in materials science, physics, chemistry, and the life sciences. This book examines the interactions between the electron beam and the specimen, the fundamental starting point for all electron microscopy. Detailed explanations are provided to help reinforce understanding, and new topics at the forefront of current research are presented. It provides readers with a deeper knowledge of the subject, particularly if they intend to simulate electron beam-specimen interactions as part of their research projects. The book covers the vast majority of commonly used electron microscopy techniques. Some of the more advanced topics (annular bright field and dopant atom imaging, atomic resolution chemical analysis, band gap measurements) provide additional value, especially for readers who have access to advanced instrumentation, such as aberration-corrected and monochromated microscopes.

Electron Beam-Specimen Interactions and Simulation Methods in Microscopy offers enlightening coverage of: the Monte-Carlo Method; Multislice Simulations; Bloch Waves in Conventional and Analytical Transmission Electron Microscopy; Bloch Waves in Scanning Transmission Electron Microscopy; Low Energy Loss and Core Loss EELS. It also supplements each chapter with clear diagrams and provides appendices at the end of the book to assist with the pre-requisites.

A detailed presentation of the physics of electron beam-specimen interactions Each chapter first discusses the background physics before moving onto simulation methods Uses computer programs to simulate electron beam-specimen interactions (presented in the form of case studies) Includes hot topics brought to light due to advances in instrumentation (particularly aberration-corrected and monochromated microscopes)

Electron Beam-Specimen Interactions and Simulation Methods in Microscopy benefits students undertaking higher education degrees, practicing electron microscopists who wish to learn more about their subject, and researchers who wish to obtain a deeper understanding of the subject matter for their own work.