Debashis Bhattacharya – författare

Visar alla böcker från författaren Debashis Bhattacharya. Handla med fri frakt och snabb leverans.

3 produkter

1. 

   Hierarchical Modeling for VLSI Circuit Testing

   Av Debashis Bhattacharya, John P. Hayes

   Inbunden, 1989

   1098 kr

   Lägg i varukorg

   Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been …

2. 

   Hierarchical Modeling for VLSI Circuit Testing

   Av Debashis Bhattacharya, John P. Hayes

   Häftad, 2011

   1098 kr

   Lägg i varukorg

   Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been …

3. 

   Hierarchical Modeling for VLSI Circuit Testing

   Av John P. Hayes, Debashis Bhattacharya

   E-bok, 2012

   1459 kr

   Lägg i varukorg

   Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been …