Edward B. Hakim – författare

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5 produkter

1. 

   Influence of Temperature on Microelectronics and System Reliability

   A Physics of Failure Approach

   Av Pradeep Lall, Michael G. Pecht m. fl.

   Häftad, 2019

   646 kr

   Lägg i varukorg

   This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at …

2. 

   Influence of Temperature on Microelectronics and System Reliability

   A Physics of Failure Approach

   Av Edward B. Hakim, Michael G. Pecht m. fl.

   E-bok, 2020

   762 kr

   Lägg i varukorg

   This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at …

3. 

   Influence of Temperature on Microelectronics and System Reliability

   A Physics of Failure Approach

   Av Edward B. Hakim, Michael G. Pecht m. fl.

   E-bok, 2020

   746 kr

   Lägg i varukorg

   This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at …

4. 

   Reliability, Test and Diagnostics

   Av Edward B. Hakim, TBD m. fl.

   Inbunden, 1989

   2035 kr

   Lägg i varukorg

5. 

   Influence of Temperature on Microelectronics and System Reliability

   A Physics of Failure Approach

   Av Pradeep Lall, Michael G. Pecht m. fl.

   Inbunden, 1997

   2096 kr

   Tillfälligt slut

   This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at …