Eric Garfunkel – författare
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6 produkter
Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices
Av Eric Garfunkel, Evgeni Gusev m. fl.
Inbunden, 1998
1643 kr
Lägg i varukorg
An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of <3 nm will be required in the near future. Given the importance of ultrathin gate dielectrics, well-focused basic scientific research and aggressive development programs must continue …
Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices
Av Eric Garfunkel, Evgeni Gusev m. fl.
Häftad, 1998
1643 kr
Lägg i varukorg
An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of <3 nm will be required in the near future. Given the importance of ultrathin gate dielectrics, well-focused basic scientific research and aggressive development programs must continue …
Advanced Materials and Technologies for Micro/Nano-Devices, Sensors and Actuators
Av Evgeni Gusev, Eric Garfunkel m. fl.
Inbunden, 2010
2188 kr
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A NATO Advanced Research Workshop (ARW) entitled “Advanced Materials and Technologies for Micro/Nano Devices, Sensors and Actuators” was held in St. Petersburg, Russia, from June 29 to July 2, 2009. The main goal of the Workshop was to examine (at a fundamental level) the very complex scientific …
Advanced Materials and Technologies for Micro/Nano-Devices, Sensors and Actuators
Av Evgeni Gusev, Eric Garfunkel m. fl.
Häftad, 2010
2188 kr
Lägg i varukorg
A NATO Advanced Research Workshop (ARW) entitled “Advanced Materials and Technologies for Micro/Nano Devices, Sensors and Actuators” was held in St. Petersburg, Russia, from June 29 to July 2, 2009. The main goal of the Workshop was to examine (at a fundamental level) the very complex scientific …
Advanced Materials and Technologies for Micro/Nano-Devices, Sensors and Actuators
Av Arthur Dideikin, Eric Garfunkel m. fl.
E-bok, 2010
2925 kr
Lägg i varukorg
A NATO Advanced Research Workshop (ARW) entitled “Advanced Materials and Technologies for Micro/Nano Devices, Sensors and Actuators” was held in St. Petersburg, Russia, from June 29 to July 2, 2009. The main goal of the Workshop was to examine (at a fundamental level) the very complex scientific …
Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices
Av Alexander Vul', Evgeni Gusev m. fl.
E-bok, 2012
2111 kr
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An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant …
