Ernst Meyer – författare

Combining the classical theories of contact mechanics and lubrication with the study of friction on the nanometer range, this multi-scale book for researchers and students alike guides the reader deftly through the mechanisms governing friction processes, based on state-of-the-art models and experimental results. The first book in the field to incorporate recent research on nanotribology with classical theories of contact mechanics, this unique text explores atomic scale scratches, non-contact friction and fishing of molecular nanowires as observed in the lab. Beginning with simple key concepts, the reader is guided through progressively more complex topics, such as contact of self-affine surfaces and nanomanipulation, in a consistent style, encompassing both macroscopic and atomistic descriptions of friction, and using unified notations to enable use by physicists and engineers across the scientific community.

Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy.

Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy.

This book offers a comprehensive review on the latest developments in the field of nanotribology. With contributed chapters covering instrumental aspects, theoretical models, and selected experimental results, this book provides a broad overview of the fundamental issues currently being investigated in the field.The updated third edition includes new topics such as molecular tribology, multiscale structural lubricity, tribofilm growth, nanoscale friction in liquids, and nanotribology at insect-plant interfaces. Written by a highly qualified group of international experts, this book aims to be a key reference on the subject for the next five to ten years, highlighting the importance of understanding the atomistic origins of friction and wear in everyday life and in technical applications.

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

This book provides an updated review on the development of scanning probe microscopy and related techniques, and the availability of computational techniques not even imaginable a few decades ago. The 36 chapters cover instrumental aspects, theoretical models and selected experimental results, thus offering a broad panoramic view on fundamental issues in nanotribology which are currently being investigated. Compared to the first edition, several topics have been added, including triboluminescence, graphene mechanics, friction and wear in liquid environments, capillary condensation, and multiscale friction modeling. Particular care has been taken to avoid overlaps and guarantee the independence of the chapters. In this way, our book aims to become a key reference on this subject for the next five to ten years to come.

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Friction force microscopy is an important analytical tool in the field of tribology on the nanometer-scale. The contact area between the probing tip and the sample is reduced to some square nanometers, corresponding to the ideal of a single asperity contact. Traditional concepts, such as friction coefficients, adhesion and elasticity and stick-slip are re-examined with this novel technique. New concepts based upon classical and quantum mechanics are investigated.