Feifei He – författare

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2 produkter

1. 

   Electromigration Modeling at Circuit Layout Level

   Av Cher Ming Tan, Feifei He

   Häftad, 2013

   545 kr

   Lägg i varukorg

   Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has …

2. 

   Electromigration Modeling at Circuit Layout Level

   Av Feifei He, Cher Ming Tan

   E-bok, 2013

   734 kr

   Lägg i varukorg

   Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has …