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Giovanni Valdrè – författare

Visar alla böcker från författaren Giovanni Valdrè. Handla med fri frakt och snabb leverans.

3 produkter

  1. David G. Rickerby, Giovanni Valdrè, Ugo Valdrè - Impact of Electron and Scanning Probe Microscopy on Materials Research, Inbunden. Tillgänglighet: Lägg i varukorg

    Impact of Electron and Scanning Probe Microscopy on Materials Research

    Av David G. Rickerby, Giovanni Valdrè m. fl.

    Inbunden, 1999

    1098 kr

    Lägg i varukorg

    This volume presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialized electron diffraction techniques are …

  2. David G. Rickerby, Giovanni Valdrè, Ugo Valdrè - Impact of Electron and Scanning Probe Microscopy on Materials Research, Häftad. Tillgänglighet: Lägg i varukorg

    Impact of Electron and Scanning Probe Microscopy on Materials Research

    Av David G. Rickerby, Giovanni Valdrè m. fl.

    Häftad, 1999

    1098 kr

    Lägg i varukorg

    The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe …

  3. Ugo Valdre, Giovanni Valdre, David G. Rickerby - Impact of Electron and Scanning Probe Microscopy on Materials Research, E-bok. Tillgänglighet: Lägg i varukorg

    Impact of Electron and Scanning Probe Microscopy on Materials Research

    Av Ugo Valdre, Giovanni Valdre m. fl.

    E-bok, 2012

    1459 kr

    Lägg i varukorg

    The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe …