Bokus

J.R. Michael – författare

Visar alla böcker från författaren J.R. Michael. Handla med fri frakt och snabb leverans.

3 produkter

  1. Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael - Scanning Electron Microscopy and X-Ray Microanalysis, Inbunden. Tillgänglighet: Lägg i varukorg

    Scanning Electron Microscopy and X-Ray Microanalysis

    Third Edition

    Av Joseph Goldstein, Dale E. Newbury m. fl.

    Inbunden, 2003

    1203 kr

    Lägg i varukorg

    In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental …

  2. Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael - Scanning Electron Microscopy and X-Ray Microanalysis, Häftad. Tillgänglighet: Lägg i varukorg

    Scanning Electron Microscopy and X-Ray Microanalysis

    Third Edition

    Av Joseph Goldstein, Dale E. Newbury m. fl.

    Häftad, 2013

    1155 kr

    Lägg i varukorg

    In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental …

  3. J.R. Michael, Linda Sawyer, Eric Lifshin, Patrick Echlin, Charles E. Lyman, David C. Joy, Dale E. Newbury, Joseph Goldstein - Scanning Electron Microscopy and X-Ray Microanalysis, E-bok. Tillgänglighet: Lägg i varukorg

    Scanning Electron Microscopy and X-Ray Microanalysis

    Third Edition

    Av J.R. Michael, Linda Sawyer m. fl.

    E-bok, 2012

    1622 kr

    Lägg i varukorg

    In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental …