Leena Singh – författare

This text covers verification strategies and methodologies for SOC verification from system level verification to the design sign-off. The topics covered include: introduction to the SOC design and verification aspects, system level verification in brief, block level verification, analog/mixed signal simulation, simulation, HW/SW Co-verification, static netlist verification, physical verification, and design sign-off in brief. All the verification aspects are illustrated with a single reference design for Bluetooth application.

"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and that the costs associated with functional verification are now outweighing the costs of chip design. To cope with these challenges engineers are increasingly relying on new design and verification methodologies and languages.  Transaction-based design and verification, constrained random stimulus generation, functional coverage analysis, and assertion-based verification are all techniques that advanced design and verification teams routinely use today. Engineers are also increasingly turning to design and verification models based on C/C++ and SystemC in order to build more abstract, higher performance hardware and software models and to escape the limitations of RTL HDLs. This new book, Advanced Verification Techniques, provides specific guidance for these advanced verification techniques. The book includes realistic examples and shows how SystemC and SCV can be applied to a variety of advanced design and verification tasks."- Stuart Swan

"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and that the costs associated with functional verification are now outweighing the costs of chip design. To cope with these challenges engineers are increasingly relying on new design and verification methodologies and languages. Transaction-based design and verification, constrained random stimulus generation, functional coverage analysis, and assertion-based verification are all techniques that advanced design and verification teams routinely use today. Engineers are also increasingly turning to design and verification models based on C/C++ and SystemC in order to build more abstract, higher performance hardware and software models and to escape the limitations of RTL HDLs. This new book, Advanced Verification Techniques, provides specific guidance for these advanced verification techniques.The book includes realistic examples and shows how SystemC and SCV can be applied to a variety of advanced design and verification tasks." - Stuart Swan

System-On-a-Chip Verification: Methodology and Techniques is the first book to cover verification strategies and methodologies for SOC verification from system level verification to the design sign- off. The topics covered include Introduction to the SOC design and verification aspects, System level verification in brief, Block level verification, Analog/mixed signal simulation, Simulation, HW/SW Co-verification, Static netlist verification, Physical verification, and Design sign-off in brief. All the verification aspects are illustrated with a single reference design for Bluetooth application. System-On-a-Chip Verification: Methodology and Techniques takes a systematic approach that covers the following aspects of verification strategy in each chapter: Explanation of the objective involved in performing verification after a given design step; Features of options available; When to use a particular option; How to select an option; and Limitations of the option. This exciting new book will be of interest to all designers and test professionals.