Muhammad Hassan – författare

This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security.Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs;Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models;Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs;Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.

This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security.

Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs;Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models;Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs;Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.

This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security.Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs;Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models;Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs;Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.

Dieses Buch beschreibt eine umfassende Kombination von Methoden, die den modernen Virtual Prototype (VP)-basierten Verifikationsfluss für heterogene Systems-on-Chip (SOCs) stark verbessern. Insbesondere kombiniert das Buch Verifikations- und Analyseaspekte über verschiedene Stufen des VP-basierten Verifikationsflusses hinweg und bietet eine neue Perspektive auf die Verifikation, indem es fortschrittliche Techniken wie metamorphes Testen, Datenfluss-Testen und Informationsfluss-Testen einsetzt. Darüber hinaus legt das Buch einen starken Schwerpunkt auf fortschrittliche, abdeckungsorientierte Methoden zur Verifizierung des funktionalen Verhaltens des SOC sowie zur Gewährleistung seiner Sicherheit.Bietet eine umfassende Einführung in den modernen VP-basierten Verifikationsablauf für heterogene SOCs;Stellt eine neuartige metamorphe Testtechnik für heterogene SOCs vor, die keine Referenzmodelle erfordert;Enthält automatisierte, fortschrittliche, auf Datenflussabdeckung basierende Methoden, die auf SystemC/AMS-basierte VP zugeschnitten sind;Beschreibt erweiterte funktionale abdeckungsgesteuerte Methoden zur Verifizierung verschiedener funktionaler Verhaltensweisen von RF-Verstärkern.