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6 produkter
6 produkter
Häftad, Tyska, 2009
826 kr
Skickas inom 3-6 vardagar
Häftad, Tyska, 2010
338 kr
Skickas inom 3-6 vardagar
Häftad, Tyska, 2010
736 kr
Skickas inom 3-6 vardagar
Inbunden, Engelska, 2022
1 631 kr
Skickas inom 10-15 vardagar
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
1 977 kr
Läs direkt efter köp
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
Häftad, Engelska, 2023
1 631 kr
Skickas inom 10-15 vardagar
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.