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Ruijing Shen – författare

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3 produkter

  1. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu - Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, Inbunden. Tillgänglighet: Lägg i varukorg

    Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

    Av Ruijing Shen, Sheldon X.-D. Tan m. fl.

    Inbunden, 2012

    1093 kr

    Lägg i varukorg

    Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design …

  2. Hao Yu, Sheldon X.-D. Tan, Ruijing Shen - Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, E-bok. Tillgänglighet: Lägg i varukorg

    Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

    Av Hao Yu, Sheldon X.-D. Tan m. fl.

    E-bok, 2014

    1459 kr

    Lägg i varukorg

    Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design …

  3. Ruijing Shen, Sheldon X.-D. Tan, Hao Yu - Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs, Häftad. Tillgänglighet: Lägg i varukorg

    Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

    Av Ruijing Shen, Sheldon X.-D. Tan m. fl.

    Häftad, 2014

    1225 kr

    Lägg i varukorg

    Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design …