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Sandeep K. Goel – författare

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4 produkter

  1. Sandeep K. Goel, Krishnendu Chakrabarty - Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits, Häftad. Tillgänglighet: Lägg i varukorg

    Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

    Av Sandeep K. Goel, Krishnendu Chakrabarty

    Häftad, 2017

    1334 kr

    Lägg i varukorg

    Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality …

  2. Krishnendu Chakrabarty, Sandeep K. Goel - Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits, E-bok. Tillgänglighet: Lägg i varukorg

    Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

    Av Krishnendu Chakrabarty, Sandeep K. Goel

    E-bok, 2017

    1576 kr

    Lägg i varukorg

    Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality …

  3. Sandeep K. Goel, Krishnendu Chakrabarty - Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits, Inbunden. Tillgänglighet: Lägg i varukorg

    Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

    Av Sandeep K. Goel, Krishnendu Chakrabarty

    Inbunden, 2013

    3386 kr

    Lägg i varukorg

    Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality …

  4. Krishnendu Chakrabarty, Sandeep K. Goel - Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits, E-bok. Tillgänglighet: Lägg i varukorg

    Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

    Av Krishnendu Chakrabarty, Sandeep K. Goel

    E-bok, 2017

    1576 kr

    Lägg i varukorg

    Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality …