Springer Series in Surface Sciences – serie

This book presents developments of techniques for detection and analysis of two electrons resulting from the interaction of a single incident electron with a solid surface.  Spin dependence in scattering of spin-polarized electrons from magnetic and non-magnetic surfaces is governed by exchange and spin-orbit effects. The effects of spin and angular electron momentum are shown through symmetry of experimental geometries: (i) normal and off normal electron incidence on a crystal surface, (ii) spin polarization directions within mirror planes of the surface, and (iii) rotation and interchange of detectors with respect to the surface normal.  Symmetry considerations establish relationships between the spin asymmetry of two-electron distributions and the spin asymmetry of Spectral Density Function of the sample, hence providing information on the spin-dependent sample electronic structure. Detailed energy and angular distributions of electron pairs carry information on the electron-electron interaction and electron correlation inside the solid. The “exchange – correlation hole” associated with Coulomb and exchange electron correlation in solids can be visualized using spin-polarized two-electron spectroscopy. Also spin entanglement of electron pairs can be probed. A description of correlated electron pairs generation from surfaces using other types of incident particles, such as photons, ions, positrons is also presented.

This monograph discusses the essential principles of the evaporationprocess by looking at it at the molecular and atomic level.In the first part methods of statistical physics, physical kinetics andnumerical modeling are outlined including the Maxwell’s distributionfunction, the Boltzmann kinetic equation, the Vlasov approach, and theCUDA technique.The distribution functions of evaporating particles are then defined.Experimental results on the evaporation coefficient and the temperaturejump on the evaporation surface are critically reviewed and compared tothe theory and numerical results presented in previous chapters.The book ends with a chapter devoted to evaporation in differentprocesses, such as boiling and cavitation.This monograph addressesgraduate students and researchers working on phase transitions andrelated fields.

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman imaging, can be integrated with other methods to produce a variety of correlative microscopy combinations. The benefits are then demonstrated and supported by numerous examples from the fields of materials science, 2D materials, the life sciences, pharmaceutical research and development, as well as the geosciences.

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years.The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.

This book presents developments of techniques for detection and analysis of two electrons resulting from the interaction of a single incident electron with a solid surface.  Spin dependence in scattering of spin-polarized electrons from magnetic and non-magnetic surfaces is governed by exchange and spin-orbit effects. The effects of spin and angular electron momentum are shown through symmetry of experimental geometries: (i) normal and off normal electron incidence on a crystal surface, (ii) spin polarization directions within mirror planes of the surface, and (iii) rotation and interchange of detectors with respect to the surface normal.  Symmetry considerations establish relationships between the spin asymmetry of two-electron distributions and the spin asymmetry of Spectral Density Function of the sample, hence providing information on the spin-dependent sample electronic structure. Detailed energy and angular distributions of electron pairs carry information on the electron-electron interaction and electron correlation inside the solid. The “exchange – correlation hole” associated with Coulomb and exchange electron correlation in solids can be visualized using spin-polarized two-electron spectroscopy. Also spin entanglement of electron pairs can be probed. A description of correlated electron pairs generation from surfaces using other types of incident particles, such as photons, ions, positrons is also presented.

This significantly extended second edition addresses the important physical phenomenon of Surface Plasmon Resonance (SPR) or Surface Plasmon Polaritons (SPP) in thin metal films, a phenomenon which is exploited in the design of a large variety of physico-chemical optical sensors. In this treatment, crucial materials aspects for design and optimization of SPR sensors are investigated and described in detail. The text covers a selection of nanometer thin metal films, ranging from free-electron to the platinum-type conductors, along with their combination with a large variety of dielectric substrate materials, and associated individual layer and opto-geometric arrangements. Whereas the first edition treated solely the metal-liquid interface, the SP-resonance conditions considered here are expanded to cover the metal-gas interface in the angular and wavelength interrogation modes, localized and long-range SP's and the influence of native oxidic ad-layers in the case of non-noble metals. Furthermore, a selection of metal grating structures that allow SP excitation is presented, as are features of radiative SP's. Finally, this treatise includes as-yet hardly explored SPR features of selected metal–metal and metal–dielectric superlattices. An in-depth multilayer Fresnel evaluation provides the mathematical tool for this optical analysis, which otherwise relies solely on experimentally determined electro-optical materials parameters.

This significantly extended second edition addresses the important physical phenomenon of Surface Plasmon Resonance (SPR) or Surface Plasmon Polaritons (SPP) in thin metal films, a phenomenon which is exploited in the design of a large variety of physico-chemical optical sensors. In this treatment, crucial materials aspects for design and optimization of SPR sensors are investigated and described in detail. The text covers a selection of nanometer thin metal films, ranging from free-electron to the platinum-type conductors, along with their combination with a large variety of dielectric substrate materials, and associated individual layer and opto-geometric arrangements. Whereas the first edition treated solely the metal-liquid interface, the SP-resonance conditions considered here are expanded to cover the metal-gas interface in the angular and wavelength interrogation modes, localized and long-range SP's and the influence of native oxidic ad-layers in the case of non-noble metals. Furthermore, a selection of metal grating structures that allow SP excitation is presented, as are features of radiative SP's. Finally, this treatise includes as-yet hardly explored SPR features of selected metal–metal and metal–dielectric superlattices. An in-depth multilayer Fresnel evaluation provides the mathematical tool for this optical analysis, which otherwise relies solely on experimentally determined electro-optical materials parameters.

This book presents photoelectron spectroscopy as a valuable method for studying the electronic structures of various solid materials in the bulk state, on surfaces, and at buried interfaces. This second edition introduces the advanced technique of high-resolution and high-efficiency spin- and momentum-resolved photoelectron spectroscopy using a novel momentum microscope, enabling high-precision measurements down to a length scale of some tens of nanometers. The book also deals with fundamental concepts and approaches to applying this and other complementary techniques, such as inverse photoemission, photoelectron diffraction, scanning tunneling spectroscopy, as well as photon spectroscopy based on (soft) x-ray absorption and resonance inelastic (soft) x-ray scattering. This book is the ideal tool to expand readers’ understanding of this marvelously versatile experimental method, as well as the electronic structures of metals and insulators.

This book presents photoelectron spectroscopy as a valuable method for studying the electronic structures of various solid materials in the bulk state, on surfaces, and at buried interfaces. This second edition introduces the advanced technique of high-resolution and high-efficiency spin- and momentum-resolved photoelectron spectroscopy using a novel momentum microscope, enabling high-precision measurements down to a length scale of some tens of nanometers. The book also deals with fundamental concepts and approaches to applying this and other complementary techniques, such as inverse photoemission, photoelectron diffraction, scanning tunneling spectroscopy, as well as photon spectroscopy based on (soft) x-ray absorption and resonance inelastic (soft) x-ray scattering. This book is the ideal tool to expand readers’ understanding of this marvelously versatile experimental method, as well as the electronic structures of metals and insulators.

This book serves as a comprehensive guide to the physics of thin-film optical spectra, bridging the gap between fundamental physics courses, such as optics, electrodynamics, quantum mechanics, and solid-state physics, and the highly specialized literature on the spectroscopy, design, and application of optical thin film coatings. It presumes a basic understanding from these courses and builds upon it.Starting from the fundamentals of physics, the book equips the reader with the ability to derive the theory of optical coatings and apply it to significant spectroscopic problems. It encompasses both classical and semiclassical approaches. The topics covered range from classical optical coatings in various spectral regions to more specialized areas such as rugate filters and ultrafast mirrors.The expanded and updated third edition places a stronger emphasis on basic physical modeling aspects and updates the description of nonlinear coating properties. Additionally, it includes an expanded collection of problems with detailed solutions and explanations, enhancing the reader’s understanding and application of the concepts.

This book provides a comprehensive exploration of contact electrification across solid-solid, solid-liquid, and gas-solid interfaces. It looks into the underlying physics mechanisms, offering theoretical models and experimental methods to quantify and understand this ubiquitous yet complex phenomenon.Covering fundamental concepts such as triboelectricity, energy band models, and tribovoltaic effects, the book discusses the interactions and charge transfer processes that occur at various interfaces. Special attention is given to the role of material properties, electron transfer dynamics, and external factors such as surface roughness and environmental conditions. Each chapter builds upon foundational principles to provide a cohesive framework for understanding both the beneficial applications and potential drawbacks of contact electrification.In addition to theoretical insights, this book highlights cutting-edge technological applications related to contact-electrification, including triboelectric nanogenerators (TENGs), self-powered sensors, and contact-electro-catalysis. Practical implementations span fields such as sustainable energy harvesting, biomedical applications, environmental sensing, and advanced materials design.Written and edited by experts in the field, this book serves as an essential resource for researchers, engineers, and advanced students in materials science, physics, chemistry, and electrical engineering. With its rigorous treatment of the subject and focus on both foundational science and applied technologies, this book is poised to set the standard for research in contact electrification for years to come.

This book provides a comprehensive exploration of contact electrification across solid-solid, solid-liquid, and gas-solid interfaces. It looks into the underlying physics mechanisms, offering theoretical models and experimental methods to quantify and understand this ubiquitous yet complex phenomenon.Covering fundamental concepts such as triboelectricity, energy band models, and tribovoltaic effects, the book discusses the interactions and charge transfer processes that occur at various interfaces. Special attention is given to the role of material properties, electron transfer dynamics, and external factors such as surface roughness and environmental conditions. Each chapter builds upon foundational principles to provide a cohesive framework for understanding both the beneficial applications and potential drawbacks of contact electrification.In addition to theoretical insights, this book highlights cutting-edge technological applications related to contact-electrification, including triboelectric nanogenerators (TENGs), self-powered sensors, and contact-electro-catalysis. Practical implementations span fields such as sustainable energy harvesting, biomedical applications, environmental sensing, and advanced materials design.Written and edited by experts in the field, this book serves as an essential resource for researchers, engineers, and advanced students in materials science, physics, chemistry, and electrical engineering. With its rigorous treatment of the subject and focus on both foundational science and applied technologies, this book is poised to set the standard for research in contact electrification for years to come.

This textbook covers key aspects of applying surface acoustic waves (SAW) in gas sensors, presenting fundamental operating principles, theoretical models, research methodologies, and sensor structures in a clear and accessible manner. It discusses single, bilayer, and multilayer sensor structures, along with a detailed theoretical description of the acoustoelectrical effect in bilayer sensors. Special attention is given to semiconductor-metal bilayer structures, such as phthalocyanine-palladium and tungsten oxide-palladium, due to their strong potential for practical applications in SAW hydrogen sensors. The book also explores future applications and research directions, including advancements in light-activated photoconductive polymer structures.

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

This book focuses on a research field that is rapidly emerging as one of the most promising ones for the global optics and photonics community: the “lab-on-fiber” technology. Inspired by the well-established "lab on-a-chip" concept, this new technology essentially envisages novel and highly functionalized devices completely integrated into a single optical fiber for both communication and sensing applications.Based on the R&D experience of some of the world's leading authorities in the fields of optics, photonics, nanotechnology, and material science, this book provides a broad and accurate description of the main developments and achievements in the lab-on-fiber technology roadmap, also highlighting the new perspectives and challenges to be faced.This book is essential for scientists interested in the cutting-edge fiber optic technology, but also for graduate students.

This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides. Numerical simulations of defective structures complete the picture developed. Defects on planar surfaces form the focus of much of the book, although the investigation of powder samples also form an important part. The experimental study of planar surfaces opens the possibility of applying the large armoury of techniques that have been developed over the last half-century to study surfaces in ultra-high vacuum. This enables the acquisition of atomic level data under well-controlled conditions, providing a stringent test of theoretical methods. The latter can then be more reliably applied to systems such as nanoparticles for which accurate methods of characterization of structure and electronic properties have yet to be developed. The book gives guidance to tailor oxide surfaces by controlling the nature and concentration of defects. The importance of defects in the physics and chemistry of metal oxide surfaces is presented in this book together with the prominent role of oxides in common life. The book contains contributions from leaders in the field. It serves as a reference for experts and beginners in the field.

This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.

The book bridges the gap between fundamental physics courses (such as optics, electrodynamics, quantum mechanics and solid state physics) and highly specialized literature on the spectroscopy, design, and application of optical thin film coatings. Basic knowledge from the above-mentioned courses is therefore presumed. Starting from fundamental physics, the book enables the reader derive the theory of optical coatings and to apply it to practically important spectroscopic problems. Both classical and semiclassical approaches are included. Examples describe the full range of classical optical coatings in various spectral regions as well as highly specialized new topics such as rugate filters and resonant grating waveguide structures. The second edition has been updated and extended with respect to probing matter in different spectral regions, homogenous and inhomogeneous line broadening mechanisms and the Fresnel formula for the effect of planar interfaces.

This book presents the method of ion beam modification of solids in realization, theory and applications in a comprehensive way. It provides a review of the physical basics of ion-solid interaction and on ion-beam induced structural modifications of solids. Ion beams are widely used to modify the physical properties of materials. A complete theory of ion stopping in matter and the calculation of the energy loss due to nuclear and electronic interactions are presented including the effect of ion channeling. To explain structural modifications due to high electronic excitations, different concepts are presented with special emphasis on the thermal spike model. Furthermore, general concepts of damage evolution as a function of ion mass, ion fluence, ion flux and temperature are described in detail and their limits and applicability are discussed. The effect of nuclear and electronic energy loss on structural modifications of solids such as damage formation, phase transitions and amorphization is reviewed for insulators and semiconductors. Finally some selected applications of ion beams are given.

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

This book focuses on a research field that is rapidly emerging as one of the most promising ones for the global optics and photonics community: the “lab-on-fiber” technology. Inspired by the well-established "lab on-a-chip" concept, this new technology essentially envisages novel and highly functionalized devices completely integrated into a single optical fiber for both communication and sensing applications.Based on the R&D experience of some of the world's leading authorities in the fields of optics, photonics, nanotechnology, and material science, this book provides a broad and accurate description of the main developments and achievements in the lab-on-fiber technology roadmap, also highlighting the new perspectives and challenges to be faced.This book is essential for scientists interested in the cutting-edge fiber optic technology, but also for graduate students.

This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides. Numerical simulations of defective structures complete the picture developed. Defects on planar surfaces form the focus of much of the book, although the investigation of powder samples also form an important part. The experimental study of planar surfaces opens the possibility of applying the large armoury of techniques that have been developed over the last half-century to study surfaces in ultra-high vacuum. This enables the acquisition of atomic level data under well-controlled conditions, providing a stringent test of theoretical methods. The latter can then be more reliably applied to systems such as nanoparticles for which accurate methods of characterization of structure and electronic properties have yet to be developed. The book gives guidance to tailor oxide surfaces by controlling the nature and concentration of defects. The importance of defects in the physics and chemistry of metal oxide surfaces is presented in this book together with the prominent role of oxides in common life. The book contains contributions from leaders in the field. It serves as a reference for experts and beginners in the field.

This book provides an overview of electrodeposition of nanomaterials from principles to modern concepts for advanced materials in science and technology. Electrochemical deposition or electrodeposition is explained for fabrication and mass production of functional and nanostructured device materials. The present book spans from principles to modern insights and concepts. It gives a comprehensive overview of the electrochemistry of materials, which is useful as basic information to understand concepts used for nanostructuring of electrodeposited materials, reviews the electrodeposition constituents, thermodynamics and kinetics of electrodeposition, electrochemical and instrumental assessment techniques and other physical factors affecting the electrodeposition mechanisms. A wide variety of nanostructured materials and related concepts and applications are explained with respect to nanocrystals, nanocrystalline films, template-based nanostructures, nanocomposite films, nanostructureson semiconductors, multilayers, mesoporous films, scanning microscopical probe assisted fabrication and galvanic replacement. This book is useful for researchers in materials science, engineering technologists and graduate students. It can also be used as a textbook for undergraduates and graduate students studying related disciplines.

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman imaging, can be integrated with other methods to produce a variety of correlative microscopy combinations. The benefits are then demonstrated and supported by numerous examples from the fields of materials science, 2D materials, the life sciences, pharmaceutical research and development, as well as the geosciences.

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years.The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.