Inbunden, Engelska, 1995
Particle-Induced X-Ray Emission Spectrometry (PIXE)
Av Johansson, Campbell, Sven A. E. Johansson, John L. Campbell, Klas G. Malmqvist
Del 184 i serien Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications
2891 kr
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Produktinformation
- Utgivningsdatum: 1995-08-18
- Mått: 162 x 237 x 27 mm
- Vikt: 851 g
- Format: Inbunden
- Språk: Engelska
- Serie: Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications
- Antal sidor: 480
- Förlag: John Wiley & Sons Inc
- ISBN: 9780471589440
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SVEN A. E. JOHANSSON received his PhD from the University of Lund in 1952. He held appointments at the National Atomic Commission, Chalmers University, and the Lund Institute of Technology. At Lund, Dr. Johansson occupied the Chair of Nuclear Physics and served as both Director of LIT and Vice Chancellor of the University of Lund. He was a member of the Swedish Academy of Engineering Science and the Royal Swedish Academy of Science, and served on the Nobel Committee for Physics. Dr. Johansson passed away in 1994.JOHN L. CAMPBELL is the Dean of the College of Physical and Engineering Science at the University of Guelph, Ontario. He joined the University of Guelph in 1968 and in 1977, was appointed Professor of Physics. Dr. Campbell received his PhD from the University of Glasgow, Scotland, and in 1982, was awarded a DSc from the same institution.KLAS G. MALMQVIST is Dean of the School of Engineering Physics at the Lund Institute of Technology. Since 1990, Dr. Malmqvist has been a Professor of Physics and Chair of Applied Nuclear Physics. Dr. Malmqvist received his PhD in nuclear physics from the Lund Institute of Technology in 1981 and qualified as Docent in Engineering Physics in 1986.
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