Introduction to Semiconductor Device Yield Modeling

AvAlbert V.Ferris- Prabhu

Inbunden, Engelska, 1992

Del i serien Electronic Materials & Devices Library

1 161 kr

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Produktinformation

Utgivningsdatum:1992-07-31
Mått:152 x 229 x 9 mm
Vikt:332 g
Format:Inbunden
Språk:Engelska
Serie:Electronic Materials & Devices Library
Antal sidor:108
Förlag:Artech House Publishers
ISBN:9780890064504

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Innehållsförteckning

Yield. Fault Probability. Effect of Defect Sizes on the Fault Probability. Counting Techniques. Yield Equations. Defect Density and Scaling Rules. Yield Prediction. Yield With Redundancy. A Yield Comparison. Productivity. Conclusion. References.

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