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Arnon M. Hurwitz, Enrique del Castillo, James Moyne - Run-to-Run Control in Semiconductor Manufacturing, E-bok

E-bok, Engelska, 2018

Run-to-Run Control in Semiconductor Manufacturing

Av Arnon M. Hurwitz, Enrique del Castillo, James Moyne

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Beskrivning
Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry''s widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
Produktinformation
  • Utgivningsdatum: 2018-10-08
  • Språk: Engelska
  • Filformat: EPUB
  • Kopieringsskydd: LCP
  • ISBN: 9781351836128
  • Förlag: CRC Press
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