Applied Scanning Probe Methods VIII

Scanning Probe Microscopy Techniques

AvBharat Bhushan,Harald Fuchs

Inbunden, Engelska, 2008

Del i serien NanoScience and Technology

1 578 kr

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Beskrivning

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol.

Produktinformation

Utgivningsdatum:2008-01-10
Mått:155 x 235 x 33 mm
Vikt:951 g
Format:Inbunden
Språk:Engelska
Serie:NanoScience and Technology
Antal sidor:465
Upplaga:2008
Förlag:Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN:9783540740797

Utforska kategorier

Innehållsförteckning

Background-Free Apertureless Near-Field Optical Imaging.- Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes.- Near Field Probes: From Optical Fibers to Optical Nanoantennas.- Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging.- Scanning Probes for the Life Sciences.- Self-Sensing Cantilever Sensor for Bioscience.- AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication.- Cantilever Spring-Constant Calibration in Atomic Force Microscopy.- Frequency Modulation Atomic Force Microscopy in Liquids.- Kelvin Probe Force Microscopy: Recent Advances and Applications.- Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale.- Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy.