Bokus

Joseph I. Goldstein – författare

Visar alla böcker från författaren Joseph I. Goldstein. Handla med fri frakt och snabb leverans.

3 produkter

  1. Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy - Scanning Electron Microscopy and X-Ray Microanalysis, Inbunden. Tillgänglighet: Lägg i varukorg

    Scanning Electron Microscopy and X-Ray Microanalysis

    Av Joseph I. Goldstein, Dale E. Newbury m. fl.

    Inbunden, 2017

    1098 kr

    Lägg i varukorg

    This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis …

  2. David C. Joy, John Henry J. Scott, Nicholas W.M. Ritchie, Joseph R. Michael, Dale E. Newbury, Joseph I. Goldstein - Scanning Electron Microscopy and X-Ray Microanalysis, E-bok. Tillgänglighet: Lägg i varukorg

    Scanning Electron Microscopy and X-Ray Microanalysis

    Av David C. Joy, John Henry J. Scott m. fl.

    E-bok, 2017

    1413 kr

    Lägg i varukorg

    This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis …

  3. Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy - Scanning Electron Microscopy and X-Ray Microanalysis, Häftad. Tillgänglighet: Lägg i varukorg

    Scanning Electron Microscopy and X-Ray Microanalysis

    Av Joseph I. Goldstein, Dale E. Newbury m. fl.

    Häftad, 2018

    1098 kr

    Lägg i varukorg

    This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis …