David C. Joy – författare
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25 produkter
Monte Carlo Modeling for Electron Microscopy and Microanalysis
Av David C. Joy
Inbunden, 1995
3864 kr
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This book describes how Monte Carlo modeling methods can be applied to Electron Microscopy and Microanalysis. Computer programs for two basic types of Monte carlo simulation are developed from physical models of the electron scattering process; a Single Scattering program capable of high accuracy …
Monte Carlo Modeling for Electron Microscopy and Microanalysis
Av David C. Joy
E-bok, 1995
2182 kr
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This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable …
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Av Patrick Echlin, C.E. Fiori m. fl.
Inbunden, 1986
1917 kr
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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to …
Principles of Analytical Electron Microscopy
Av Joseph Goldstein, David C. Joy m. fl.
Inbunden, 1986
1643 kr
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Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and …
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
A Laboratory Workbook
Av Charles E. Lyman, Dale E. Newbury m. fl.
Häftad, 1990
1092 kr
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During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information …
Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
Av Joseph Goldstein, Dale E. Newbury m. fl.
Inbunden, 2003
1207 kr
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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental …
Scanning Electron Microscopy and X-Ray Microanalysis
A Text for Biologists, Materials Scientists, and Geologists
Av Joseph Goldstein, Dale E. Newbury m. fl.
Häftad, 2011
1098 kr
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In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission …
Scanning Electron Microscopy and X-Ray Microanalysis
A Text for Biologists, Materials Scientists, and Geologists
Av Eric Lifshin, Charles Fiori m. fl.
E-bok, 2012
1459 kr
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In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission …
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
A Laboratory Workbook
Av Klaus-Rudiger Peters, Eric Lifshin m. fl.
E-bok, 2012
1459 kr
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During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information …
Scanning Electron Microscopy and X-Ray Microanalysis
A Text for Biologists, Materials Scientists, and Geologists
Av Eric Lifshin, Charles Fiori m. fl.
E-bok, 2013
1416 kr
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This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held …
Scanning Electron Microscopy and X-Ray Microanalysis
A Text for Biologists, Materials Scientists, and Geologists
Av Joseph Goldstein, Dale E. Newbury m. fl.
Häftad, 2013
1098 kr
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This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held …
Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
Av Joseph Goldstein, Dale E. Newbury m. fl.
Häftad, 2013
1155 kr
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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental …
Introduction to Electron Holography
Av Edgar Völkl, Lawrence F. Allard m. fl.
Häftad, 2012
1098 kr
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Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book's `how to' aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the …
Helium Ion Microscopy
Principles and Applications
Av David C. Joy
Häftad, 2013
552 kr
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Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered …
Helium Ion Microscopy
Principles and Applications
Av David C. Joy
E-bok, 2013
712 kr
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Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered …
Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
Av J.R. Michael, Linda Sawyer m. fl.
E-bok, 2012
1622 kr
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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental …
Introduction to Electron Holography
Av David C. Joy, Lawrence F. Allard m. fl.
E-bok, 2013
1459 kr
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Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book''s `how to'' aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the …
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Av Dale E. Newbury, David C. Joy m. fl.
E-bok, 2013
1470 kr
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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to …
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Av Patrick Echlin, C.E. Fiori m. fl.
Häftad, 2013
1130 kr
Lägg i varukorg
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to …
Principles of Analytical Electron Microscopy
Av Alton D. Romig Jr., David C. Joy m. fl.
E-bok, 2013
2044 kr
Lägg i varukorg
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and …
Principles of Analytical Electron Microscopy
Av Joseph Goldstein, David C. Joy
2013
667 kr
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Principles of Analytical Electron Microscopy
Av Joseph Goldstein, David C. Joy m. fl.
Häftad, 2013
1475 kr
Lägg i varukorg
Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and …
Scanning Electron Microscopy and X-Ray Microanalysis
Av Joseph I. Goldstein, Dale E. Newbury m. fl.
Inbunden, 2017
1098 kr
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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis …
Scanning Electron Microscopy and X-Ray Microanalysis
Av David C. Joy, John Henry J. Scott m. fl.
E-bok, 2017
1413 kr
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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis …
Scanning Electron Microscopy and X-Ray Microanalysis
Av Joseph I. Goldstein, Dale E. Newbury m. fl.
Häftad, 2018
1098 kr
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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis …
