William A. McGahan – författare
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Spectroscopic Ellipsometry and Reflectometry
A User's Guide
Av Harland G. Tompkins, William A. McGahan
Inbunden, 1999
2155 kr
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While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques …
