Zheng Wei – författare

Written by respected experts, this book highlights the latest findings on the electromagnetic ultrasonic guided wave (UGW) imaging method. It introduces main topics as the Time of Flight (TOF) extraction method for the guided wave signal, tomography and scattering imaging methods which can be used to improve the imaging accuracy of defects. Further, it offers essential insights into how electromagnetic UGW can be used in nondestructive testing (NDT) and defect imaging. As such, the book provides valuable information, useful methods and practical experiments that will benefit researchers, scientists and engineers in the field of NDT.