Zhenghao Gan – författare
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5 produkter
Semiconductor Process Reliability in Practice
Av Zhenghao Gan, Waisum Wong m. fl.
Inbunden, 2012
1727 kr
Lägg i varukorg
Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product. Proven processes for ensuring semiconductor device reliability Co-written by experts in the field, …
Semiconductor Process Reliability in Practice
Av Juin J. Liou, Waisum Wong m. fl.
E-bok, 2012
2053 kr
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Proven processes for ensuring semiconductor device reliability Co-written by experts in the field, Semiconductor Process Reliability in Practice contains detailed descriptions and analyses of reliability and qualification for semiconductor device manufacturing and discusses the underlying physics …
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Av Cher Ming Tan, Wei Li m. fl.
Inbunden, 2011
1095 kr
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and …
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Av Yuejin Hou, Zhenghao Gan m. fl.
E-bok, 2011
1427 kr
Lägg i varukorg
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and …
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Av Cher Ming Tan, Wei Li m. fl.
Häftad, 2013
1095 kr
Lägg i varukorg
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and …