Dimensional Metrology

Han Haitjema is Emeritus Professor at the KU Leuven, Belgium, and a metrologist at Mitutoyo Europe. Prior to these positions, he was the director of the Mitutoyo Research Center Europe, an assistant professor at the TU-Eindhoven in the Precision Engineering group of Professor Schellekens and a scientist covering dimensional metrology at the VSL, the National Metrology Institute of the Netherlands. He loves dimensional metrology in all its aspects, from fundamental physics to quality control, and the application of mathematical and basic principles to new and existing calibration methods. He is a fellow of the CIRP, a member of the board of experts for the Dutch national standards and the editor-in-chief of the journal Metrology.Richard Leach is Professor of Metrology at the University of Nottingham and grew the Manufacturing Metrology Team. Prior to this position, he was at the National Physical Laboratory from 1990 to 2014. His primary love is instrument building, from concept to final installation, and his current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, development of methods for measuring 3D structures, uncertainty evaluation and theoretical methods to model optical instruments. During his career, he was a leader of several professional societies and a visiting professor at Loughborough University and the Harbin Institute of Technology. These days he is partially retired and focusing on an ERC advanced grant on using advanced mathematics and machine learning to increase optical instrument data processing.

• 1. Basic Concepts. 2. General Principles of Dimensional Metrology. 3. Measurement Uncertainty. 4. Interferometry. 5. Sensor Principles. 6. Material Dimensional and Angle Measures. 7. Dimensional Measurement Equipment and Measurands. 8. Coordinate Measurements. 9. Surface Topography Filtering and Characterization.