This book constitutes the refereed proceedings of three joint events - the International Workshop on Software Measurement, IWSM 2008, the DASMA Metrik Kongress, Metrikon 2008, and the International Conference on Software Process and Product Measurement, Mensura 2008, held in Munich, Germany, in November 2008. The 30 revised full papers presented were carefully reviewed and selected from over 50 submissions for inclusion in the book. The papers are organized in topical sections on estimation models, measurement methodology, effort estimation, measurement programs, new approaches, prozessbewertung, size measurement, education, measurement in software lifecycle, and product measurement.

This book constitutes the refereed proceedings of three joint events - the International Workshop on Software Measurement, IWSM 2008, the DASMA Metrik Kongress, Metrikon 2008, and the International Conference on Software Process and Product Measurement, Mensura 2008, held in Munich, Germany, in November 2008. The 30 revised full papers presented were carefully reviewed and selected from over 50 submissions for inclusion in the book. The papers are organized in topical sections on estimation models, measurement methodology, effort estimation, measurement programs, new approaches, prozessbewertung, size measurement, education, measurement in software lifecycle, and product measurement.

This book constitutes the refereed proceedings of three joint events - the International Workshop on Software Measurement, IWSM 2008, the DASMA Metrik Kongress, Metrikon 2008, and the International Conference on Software Process and Product Measurement, Mensura 2008, held in Munich, Germany, in November 2008. The 30 revised full papers presented were carefully reviewed and selected from over 50 submissions for inclusion in the book. The papers are organized in topical sections on estimation models, measurement methodology, effort estimation, measurement programs, new approaches, prozessbewertung, size measurement, education, measurement in software lifecycle, and product measurement.