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Providing a reliable and consolidated treatment of the principles behind large-area electronics, this book provides a comprehensive review of the design challenges associated with building circuits and systems from thin-film transistors. The authors describe the architecture, fabrication and design considerations for the principal types of TFT and their numerous applications. The practicalities of device non-ideality are also addressed and the specific design considerations necessitated by instabilities and non-uniformities in existing fabrication technologies. Containing device-circuit information, discussion of electronic solutions that compensate for material deficiencies, and design methodologies applicable to a wide variety of organic and inorganic disordered materials, this is an essential reference for all researchers, circuit and device engineers working on large-area electronics.

Touch screen panels (TSPs) have become an integral part of modern-day lifestyle. To enhance user experience, attributes such as form-factor flexibility, multi-dimensional sensing, low power consumption and low cost have become highly desirable. This Element addresses the design of multi-functional TSPs with integrated concurrent capture of ubiquitous capacitive touch signals and force information. It compares and contrasts interactive technologies and presents design considerations for multi-dimensional touch screens with high detection sensitivity, accuracy and resolution.

75th Anniversary of the Transistor 75th anniversary commemorative volume reflecting the transistor's development since inception to current state of the art75th Anniversary of the Transistor is a commemorative anniversary volume to celebrate the invention of the transistor. The anniversary volume was conceived by the IEEE Electron Devices Society (EDS) to provide comprehensive yet compact coverage of the historical perspectives underlying the invention of the transistor and its subsequent evolution into a multitude of integration and manufacturing technologies and applications.The book reflects the transistor's development since inception to the current state of the art that continues to enable scaling to very large-scale integrated circuits of higher functionality and speed. The stages in this evolution covered are in chronological order to reflect historical developments.Narratives and experiences are provided by a select number of venerated industry and academic leaders, and retired veterans, of the semiconductor industry. 75th Anniversary of the Transistor highlights: Historical perspectives of the state-of-the-art pre-solid-state-transistor world (pre-1947) leading to the invention of the transistorInvention of the bipolar junction transistor (BJT) and analytical formulations by Shockley (1948) and their impact on the semiconductor industryLarge scale integration, Moore's Law (1965) and transistor scaling (1974), and MOS/LSI, including flash memories — SRAMs, DRAMs (1963), and the Toshiba NAND flash memory (1989)Image sensors (1986), including charge-coupled devices, and related microsensor applicationsWith comprehensive yet succinct and accessible coverage of one of the cornerstones of modern technology, 75th Anniversary of the Transistor is an essential reference for engineers, researchers, and undergraduate students looking for historical perspective from leaders in the field.

Presents a landmark volume documenting 100 years of field-effect transistor innovation and applications The invention of the field-effect transistor (FET) in 1925 transformed the trajectory of modern civilization, enabling virtually every electronic device in existence today. From the earliest integrated circuits to the most advanced computers and smartphones, the FET has served as the indispensable foundation of contemporary information technology. The FET Centennial: Celebrating the Field-Effect Transistor commemorates this milestone by gathering a distinguished group of contributors to provide a comprehensive account of the device’s history, global development, diverse applications, and potential future directions. This unique volume begins with an in-depth exploration of the history and evolution of FET technology, including the MOSFET’s rise and international advances across the United States, Europe, and Asia. It then highlights critical applications and integration processes, ranging from memory and logic devices to CMOS image sensors, analog/RF CMOS, and emerging thin-film and wide-bandgap transistors. Finally, it addresses state-of-the-art developments, such as 3D and gate-all-around FETs, nanoscale transport phenomena, and the incorporation of novel 2D materials, while considering the possibility of what is next for the FET and what might come after. A singular resource that not only documents a century of achievements but also contextualizes the field-effect transistor's enduring importance and likely trajectory in the decades ahead, The FET Centennial: Addresses both historical milestones and technological disruptions shaping current and future electronicsExamines international research and development with narratives from the United States, Europe, and AsiaCovers device structures from MOSFETs to III-V and 2D-material-based FETsIncludes forward-looking analyses of nanoscale transport, 3D architectures, and GAAFET innovationsFeatures detailed coverage of process integration, interconnects, lithography, and compact modelingAuthored by globally recognized experts with leadership roles in academia, industry, and professional societies, The FET Centennial: Celebrating the Field-Effect Transistor is essential reading for graduate and senior undergraduate students in electrical engineering, materials science, and applied physics courses such as Semiconductor Devices, Integrated Circuit Technology, and Microelectronics. It is also an indispensable reference for researchers, practicing engineers, and historians of science and technology.

Amorphous, nano-, micro- and polycrystalline silicon thin films and associated alloys are used in a plethora of applications ranging from active matrix displays and imaging arrays to solar panels. These applications make large-area electronics the fastest growing semiconductor technology today, pushing material requirements and device performance to new limits. This book brings together researchers to share their expertise. Materials addressed include amorphous, nano-, micro- and polycrystalline silicon, and their alloys with germanium, carbon and other elements. Topics include: the understanding of growth processes; producing high-quality films at high growth rates or low temperatures; in situ characterization techniques for monitoring growth; understanding amorphous, mixed-phase and crystalline structures, along with the principles for augmenting crystallinity; developing post-deposition processes; identifying fundamental issues in electronic structure and carrier transport in 3D, 2D and 1D; understanding metastability and the role of hydrogen; integrating photovoltaic devices and thin-film electronics into systems on glass, flexible polymeric and other nonconventional substrates; and designing, fabricating and testing devices and applications.

Thin-film silicon materials and their alloys underpin a diverse range of electronic systems, from active matrix flat-panel displays, through solar panels for the 'green-power' generation, to surface micromanaged MEMS devices. Thin-film silicon can possess a diverse range of structures, from being fully amorphous to fully polycrystalline, as well as allowing mixed-phase states, such as micro- and nanocrystalline silicon. Such diversity has made large-area electronics one of the fastest growing semiconductor technologies, although not without introducing some complexity. This book addresses issues related to both fundamental materials science and applied technology and offers an overview of studies on film growth and crystallization, materials characterization, defects, metastability and carrier transport, as well as devices such as solar cells and thin-film transistors. The importance of developing efficient solar cells is reflected in the number of reports that seek to improve lifetime and efficiency, as well as light trapping, in solar cells.

This textbook presents a comprehensive treatment of touch technologies, explaining current mainstream and new contact/non-contact based human-machine interactivity (HMI) techniques, which are ubiquitous in modern electronic devices and allow machines to exchange information with users in an efficient and reliable manner. The book provides a detailed study of HMI working principles and practical product examples. Haptic, which has become essential for users to gain immersive experience, is also discussed. The book concludes with an overview of novel applications enabled by emerging technologies, such as advanced materials, virtual reality and machine learning, providing a roadmap for possible development trends for touch interactivities. The book can be used as a graduate text for students in display and touch interface technology courses in electrical and computer engineering, and a professional reference for researchers, practicing engineers, and product designers working in broadareas of engineering.Helps students understand the working principles of current touch technologies;Offers design considerations for prototypes and products;Provides seamless connectivity between broad subject areas involved in HMI, including material science, microelectronic circuits, mechanical engineering, and digital signal processing.

This textbook presents a comprehensive treatment of touch technologies, explaining current mainstream and new contact/non-contact based human-machine interactivity (HMI) techniques, which are ubiquitous in modern electronic devices and allow machines to exchange information with users in an efficient and reliable manner. The book provides a detailed study of HMI working principles and practical product examples. Haptic, which has become essential for users to gain immersive experience, is also discussed. The book concludes with an overview of novel applications enabled by emerging technologies, such as advanced materials, virtual reality and machine learning, providing a roadmap for possible development trends for touch interactivities. The book can be used as a graduate text for students in display and touch interface technology courses in electrical and computer engineering, and a professional reference for researchers, practicing engineers, and product designers working in broadareas of engineering.Helps students understand the working principles of current touch technologies;Offers design considerations for prototypes and products;Provides seamless connectivity between broad subject areas involved in HMI, including material science, microelectronic circuits, mechanical engineering, and digital signal processing.

As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.

As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. For example, the new generation of semiconductor inspection systems is being pushed to image at increasingly shorter DUV wavelengths to facilitate inspection of deep sub-micron features in integrated circuits. DUV-sensitive charge-coupled device (CCD) cameras are in demand for these applications. Although CCD cameras that are responsive at DUV wavelengths are now available, their long-term stability is still a major concern. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.