Microbeam Analysis

Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000

AvD Williams,R Shimizu

Inbunden, Engelska, 2000

Del i serien Institute of Physics Conference Series

4 106 kr

Tillfälligt slut

Beskrivning

Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.

Produktinformation

Utgivningsdatum:2000-01-01
Mått:156 x 234 x undefined mm
Vikt:1 020 g
Format:Inbunden
Språk:Engelska
Serie:Institute of Physics Conference Series
Antal sidor:284
Förlag:Taylor & Francis Ltd
ISBN:9780750306850

Utforska kategorier

Materietillstånd inom Naturvetenskap och teknik

Innehållsförteckning

Coverage includes: Overview of microanalytical techniques; Interactions of electron and photons with matter; Monte Carlo simulation: a tool to understand practical problems; Analytical electron microscopy; Recent developments in Auger electron spectroscopy and microscopy; Quantification procedures in EPMA; Analysis of thin surface layers and multilayers by EPMA; Standardless quantitative analysis; Image processing and microscopy; Quantification of X-ray spectra; Analysis of ultra-light elements by EPMA; Sample preparation; Applications of energy dispersive spectrometry in materails science; Difficulties in microprobe analysis; Applications of electron energy loss spectroscopy; X-ray emission valence band spectrometry; Radiation damage and charging effects in SEM, EPMA and related techniques; Electron spectroscopy: principles and applications; Future applications.