System-on-Chip

Next generation electronics

AvBashir M, Al-Hashimi,Bashir M. Al-Hashimi

Inbunden, Engelska, 2006

Del i serien Materials, Circuits and Devices

1 765 kr

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Beskrivning

System-on-Chip (SoC) is believed to represent the next major market for microelectronics, and there is a considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. The field of SoC is broad and expanding and at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum of books, journals, and conference proceedings. This edited book is an attempt to provide a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas. In particular, the book covers the general principles and ideas of designing, validating and testing complex embedded computing systems and their underlying tradeoffs. Twenty-five international research groups have contributed to the book. Each contribution has an up-to-date survey highlighting the key achievements and future trends. To facilitate the understanding of the various topics covered in the book, each chapter has some background covering the basic principles, and extensive list of references. To enhance the book readability, the chapters are grouped into eight parts, each part examining a particular theme of SoC, including system design, embedded software, power management, reconfigurable computing, network-on-chip, verification and test. The book will be of interest to graduate students, designers and managers working in Electronic and Computer engineering.

Produktinformation

Utgivningsdatum:2006-01-10
Mått:156 x 234 x 56 mm
Vikt:1 451 g
Format:Inbunden
Språk:Engelska
Serie:Materials, Circuits and Devices
Antal sidor:944
Förlag:Institution of Engineering and Technology
ISBN:9780863415524

Utforska kategorier

Elektronik och kommunikationer inom Naturvetenskap och teknik

Mer om författaren

Bashir M. Al-Hashimi is professor of Computer Engineering at the School of Electronics and Computer Science, University of Southampton, UK. Professor Al-Hashimi is Editor-in-Chief, IEE Proceedings: Computer and Digital Techniques. He is a Fellow of the IEE.

Innehållsförteckning

Part 1: System-level designChapter 1: Multi-criteria decision making in embedded system designChapter 2: System-level performance analysis - the SymTA/S approachChapter 3: Analysis and optimisation of heterogeneous real-time embedded systemsChapter 4: Hardware/software partitioning of operating systems: focus on deadlock avoidanceChapter 5: Models of computation in the design processChapter 6: Architecture description languages for programmable embedded systemsPart 2: Embedded softwareChapter 7: Concurrent models of computation for embedded softwareChapter 8: Retargetable compilers and architecture exploration for embedded processorsChapter 9: Software power optimisationPart 3: Power reduction and managementChapter 10: Power-efficient data management for dynamic applicationsChapter 11: Low power system scheduling, synthesis and displaysChapter 12: Power minimisation techniques at the RT-level and belowChapter 13: Leakage power analysis and reduction for nano-scale circuitsPart 4: Reconfigurable computingChapter 14: Reconfigurable computing: architectures and design methodsPart 5: Architectural synthesisChapter 15: CAD tools for embedded analogue circuits in mixed-signal integrated Systems-on-ChipChapter 16: Clock-less circuits and system synthesisPart 6: Network-on-chipChapter 17: Network-on-chip architectures and design methodsChapter 18: Asynchronous on-chip networksPart 7: Simulation and verificationChapter 19: Covalidation of complex hardware/software systemsChapter 20: Hardware/software cosimulation from interface perspectiveChapter 21: System-level validation using formal techniquesPart 8: Manufacturing testChapter 22: Efficient modular testing and test resource partitioning for core-based SoCsChapter 23: On-chip test infrastructure design for optimal multi-site testingChapter 24: High-resolution flash time-to-digital conversion and calibration for system-on-chip testingChapter 25: Yield and reliability prediction for DSM circuits