Bokus

Frontiers in Electronic Testing

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  1. Testability Concepts for Digital ICs

    Testability Concepts for Digital ICs

    Del 3 · F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen · 1995

  2. Efficient Branch and Bound Search with Application to Computer-Aided Design

    Efficient Branch and Bound Search with Application to Computer-Aided Design

    Del 4 · Xinghao Chen, Michael L. Bushnell · 1995

  3. From Contamination to Defects, Faults and Yield Loss

    From Contamination to Defects, Faults and Yield Loss

    Del 5 · Jitendra B. Khare, Wojciech Maly · 1996

  4. Introduction to IDDQ Testing

    Introduction to IDDQ Testing

    Del 8 · S. Chakravarty, Paul J. Thadikaran · 1997

  5. On-Line Testing for VLSI

    On-Line Testing for VLSI

    Del 11 · Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan · 1998

  6. Formal Equivalence Checking and Design Debugging

    Formal Equivalence Checking and Design Debugging

    Del 12 · Shi-Yu Huang, Kwang-Ting (Tim) Cheng · 1998

  7. Research Perspectives and Case Studies in System Test and Diagnosis

    Research Perspectives and Case Studies in System Test and Diagnosis

    Del 13 · John W. Sheppard, William R. Simpson · 1998

  8. Delay Fault Testing for VLSI Circuits

    Delay Fault Testing for VLSI Circuits

    Del 14 · Angela Krstic, Kwang-Ting (Tim) Cheng · 1998

  9. Design for AT-Speed Test, Diagnosis and Measurement

    Design for AT-Speed Test, Diagnosis and Measurement

    Del 15 · Benoit Nadeau-Dostie · 1999

  10. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    Del 17 · M. Bushnell, Vishwani Agrawal · 2000

  11. Boundary-Scan Interconnect Diagnosis

    Boundary-Scan Interconnect Diagnosis

    Del 18 · José T. de Sousa, Peter Y.K. Cheung · 2001

  12. Designer’s Guide to Built-In Self-Test

    Designer’s Guide to Built-In Self-Test

    Del 19 · Charles E. Stroud · 2002

  13. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

    SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

    Del 21 · Krishnendu Chakrabarty · 2002

  14. Elements of STIL

    Elements of STIL

    Del 24 · Gregory A. Maston, Tony R. Taylor, Julie N. Villar · 2003

  15. Verification by Error Modeling

    Verification by Error Modeling

    Del 25 · Katarzyna Radecka, Zeljko Zilic · 2003

  16. Testing Static Random Access Memories

    Testing Static Random Access Memories

    Del 26 · Said Hamdioui · 2004

  17. Embedded Processor-Based Self-Test

    Embedded Processor-Based Self-Test

    Del 28 · Dimitris Gizopoulos, A. Paschalis, Yervant Zorian · 2004

  18. Introduction to Advanced System-on-Chip Test Design and Optimization

    Introduction to Advanced System-on-Chip Test Design and Optimization

    Del 29 · Erik Larsson · 2005

  19. Data Mining and Diagnosing IC Fails

    Data Mining and Diagnosing IC Fails

    Del 31 · Leendert M. Huisman · 2005

  20. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

    Del 34 · Manoj Sachdev, José Pineda de Gyvez · 2007

  21. Emerging Nanotechnologies

    Emerging Nanotechnologies

    Del 37 · Mohammad Tehranipoor · 2007

  22. Fault Diagnosis of Analog Integrated Circuits

    Fault Diagnosis of Analog Integrated Circuits

    Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha · 2005

  23. Fault-Tolerance Techniques for SRAM-Based FPGAs

    Fault-Tolerance Techniques for SRAM-Based FPGAs

    Fernanda Lima Kastensmidt, Ricardo Reis · 2006

  24. Digital Timing Measurements

    Digital Timing Measurements

    Wolfgang Maichen · 2006

  25. Analog and Mixed-Signal Boundary-Scan

    Analog and Mixed-Signal Boundary-Scan

    Adam Osseiran · 1999

  26. Reasoning in Boolean Networks

    Reasoning in Boolean Networks

    Wolfgang Kunz, Dominik Stoffel · 1997

  27. Advances in Electronic Testing

    Advances in Electronic Testing

    Dimitris Gizopoulos · 2006

  28. Core Test Wrapper Handbook

    Core Test Wrapper Handbook

    Francisco da Silva, Teresa McLaurin, Tom Waayers · 2006

  29. Power-Constrained Testing of VLSI Circuits

    Power-Constrained Testing of VLSI Circuits

    Nicola Nicolici, Bashir M. Al-Hashimi · 2003

  30. Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

    Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

    Alfredo Benso, Paolo Prinetto · 2003

  31. Multi-Chip Module Test Strategies

    Multi-Chip Module Test Strategies

    Yervant Zorian · 1997

  32. Test Resource Partitioning for System-on-a-Chip

    Test Resource Partitioning for System-on-a-Chip

    Vikram Iyengar, Anshuman Chandra · 2002

  33. High Performance Memory Testing

    High Performance Memory Testing

    R. Dean Adams · 2002

  34. Oscillation-Based Test in Mixed-Signal Circuits

    Oscillation-Based Test in Mixed-Signal Circuits

    Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, Jose Luis Huertas Díaz · 2006

  35. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

    Andrei Pavlov, Manoj Sachdev · 2008

  36. New Methods of Concurrent Checking

    New Methods of Concurrent Checking

    Michael Gössel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld · 2008

  37. Soft Errors in Modern Electronic Systems

    Soft Errors in Modern Electronic Systems

    Michael Nicolaidis · 2010

  38. Timing Performance of Nanometer Digital Circuits Under Process Variations

    Timing Performance of Nanometer Digital Circuits Under Process Variations

    Victor Champac, Jose Garcia Gervacio · 2019

  39. Models in Hardware Testing

    Models in Hardware Testing

    Hans-Joachim Wunderlich · 2009