Frontiers in Electronic Testing – serie
Visar alla böcker i serien Frontiers in Electronic Testing. Handla med fri frakt och snabb leverans.
78 produkter
Data Mining and Diagnosing IC Fails
Inbunden, 2005
1098 kr
Lägg i varukorg
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of …
Fault Diagnosis of Analog Integrated Circuits
Av Prithviraj Kabisatpathy, Alok Barua m. fl.
Inbunden, 2005
1098 kr
Lägg i varukorg
System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In …
Advances in Electronic Testing
Challenges and Methodologies
Inbunden, 2006
1643 kr
Lägg i varukorg
Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and …
Core Test Wrapper Handbook
Rationale and Application of IEEE Std. 1500™
Av Francisco da Silva, Teresa McLaurin m. fl.
Inbunden, 2006
1643 kr
Lägg i varukorg
In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order …
Fault-Tolerance Techniques for SRAM-Based FPGAs
Av Fernanda Lima Kastensmidt, Ricardo Reis
Inbunden, 2006
1098 kr
Lägg i varukorg
Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication …
Digital Timing Measurements
From Scopes and Probes to Timing and Jitter
Inbunden, 2006
1643 kr
Lägg i varukorg
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this endeavour, an engineer needs a knowledge base covering …
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Av Manoj Sachdev, José Pineda de Gyvez
Inbunden, 2007
2188 kr
Lägg i varukorg
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality …
Emerging Nanotechnologies
Test, Defect Tolerance, and Reliability
Inbunden, 2007
1643 kr
Lägg i varukorg
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies …
Boundary-Scan Interconnect Diagnosis
Av José T. de Sousa, Peter Y.K. Cheung
Inbunden, 2001
1643 kr
Lägg i varukorg
This title explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. Its importance has to do with designing complex electronic systems using pre-designed intellectual property (IP) cores, which is becoming …
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Av M. Bushnell, Vishwani Agrawal
Inbunden, 2000
1425 kr
Lägg i varukorg
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have …
On-Line Testing for VLSI
Av Michael Nicolaidis, Yervant Zorian m. fl.
Inbunden, 1998
1098 kr
Lägg i varukorg
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be …
Formal Equivalence Checking and Design Debugging
Av Shi-Yu Huang, Kwang-Ting (Tim) Cheng
Inbunden, 1998
2029 kr
Lägg i varukorg
Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging. The first part of the book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to …
Research Perspectives and Case Studies in System Test and Diagnosis
Av John W. Sheppard, William R. Simpson
Inbunden, 1998
1643 kr
Lägg i varukorg
System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar …
Delay Fault Testing for VLSI Circuits
Av Angela Krstic, Kwang-Ting (Tim) Cheng
Inbunden, 1998
1643 kr
Lägg i varukorg
With the ever-increasing speed of integrated circuits, violations of the performance specifications are becoming a major factor affecting the product quality level. The need for testing timing defects is further expected to grow with the late 20th-century design trend of moving towards deep …
Design for AT-Speed Test, Diagnosis and Measurement
Inbunden, 1999
1643 kr
Lägg i varukorg
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how …
Analog and Mixed-Signal Boundary-Scan
A Guide to the IEEE 1149.4 Test Standard
Inbunden, 1999
1643 kr
Lägg i varukorg
This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have …
Testability Concepts for Digital ICs
The Macro Test Approach
Av F.P.M. Beenker, R.G. Bennetts m. fl.
Inbunden, 1995
1635 kr
Lägg i varukorg
This volume considers testability aspects for digital ICs. The strategy taken is to integrate the testability aspects into the design and manufacturing of ICs and, for each IC design project, to give a precise definition of the boundary conditions, responsibilities, interfaces and communications …
Efficient Branch and Bound Search with Application to Computer-Aided Design
Av Xinghao Chen, Michael L. Bushnell
Inbunden, 1995
1098 kr
Lägg i varukorg
Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and many important optimization problems. In many applications, the classic branch-and-bound search methods perform duplications of computations, or rely …
From Contamination to Defects, Faults and Yield Loss
Simulation and Applications
Av Jitendra B. Khare, Wojciech Maly
Inbunden, 1996
1098 kr
Lägg i varukorg
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in …
Multi-Chip Module Test Strategies
Inbunden, 1997
1098 kr
Lägg i varukorg
Multi-chips modules (MCMs) in the late 1990s consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. This volume of research presents …
Reasoning in Boolean Networks
Logic Synthesis and Verification Using Testing Techniques
Av Wolfgang Kunz, Dominik Stoffel
Inbunden, 1997
1692 kr
Lägg i varukorg
Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation and formal verification of digital circuits. The book presents the central idea of approaching design automation problems for logic-level circuits …
Introduction to IDDQ Testing
Av S. Chakravarty, Paul J. Thadikaran
Inbunden, 1997
1098 kr
Lägg i varukorg
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the …
Embedded Processor-Based Self-Test
Av Dimitris Gizopoulos, A. Paschalis m. fl.
Inbunden, 2004
1692 kr
Lägg i varukorg
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques …
Introduction to Advanced System-on-Chip Test Design and Optimization
Av Erik Larsson
Inbunden, 2005
1643 kr
Lägg i varukorg
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design …
Oscillation-Based Test in Mixed-Signal Circuits
Av Gloria Huertas Sánchez, Diego Vázquez García de la Vega m. fl.
Inbunden, 2006
1643 kr
Lägg i varukorg
Oscillation-Based Test in Mixed-Signal Circuits presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results here presented allow to assert, not only from a theoretical point of view, but also based on a wide …
Designer’s Guide to Built-In Self-Test
Inbunden, 2002
2188 kr
Lägg i varukorg
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is …
Test Resource Partitioning for System-on-a-Chip
Av Vikram Iyengar, Anshuman Chandra
Inbunden, 2002
1098 kr
Lägg i varukorg
This work explores test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged …
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
Inbunden, 2002
1098 kr
Lägg i varukorg
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially …
Power-Constrained Testing of VLSI Circuits
A Guide to the IEEE 1149.4 Test Standard
Av Nicola Nicolici, Bashir M. Al-Hashimi
Inbunden, 2003
1098 kr
Lägg i varukorg
Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power …
High Performance Memory Testing
Design Principles, Fault Modeling and Self-Test
Inbunden, 2002
1643 kr
Lägg i varukorg
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and …
